Please use this identifier to cite or link to this item: https://hdl.handle.net/10955/1264
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dc.contributor.authorGiordano, Carlo-
dc.contributor.authorPantano, Pietro-
dc.contributor.authorPace, Calogero-
dc.date.accessioned2017-11-03T14:52:19Z-
dc.date.available2017-11-03T14:52:19Z-
dc.date.issued2014-11-17-
dc.identifier.urihttp://hdl.handle.net/10955/1264-
dc.descriptionScuola di dottorato"Archimede" Scienza e Tecnologia dei Sistemi Complessi, Ciclo XXVII a.a. 2014en_US
dc.description.sponsorshipUniversità della Calabriaen_US
dc.language.isoenen_US
dc.relation.ispartofseriesING-INF/01;-
dc.subjectElettronicaen_US
dc.subjectDispositivi elettronicien_US
dc.titleNeutron induced single event burnout on power mosfetsen_US
dc.typeThesisen_US
Appears in Collections:Dipartimento di Fisica - Tesi di Dottorato

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